Full-Field Measurement of Deformation of Recycled Paper Using Electronic Speckle Pattern Interferometry
Umezaki, Eisaku, Takakuwa, JyunnosukeVolume:
270-273
Year:
2004
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.270-273.686
File:
PDF, 370 KB
english, 2004