Scanning photo-induced impedance microscopy—an impedance...

Scanning photo-induced impedance microscopy—an impedance based imaging technique

Steffi Krause, Habib Talabani, Ming Xu, Werner Moritz, John Griffiths
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Volume:
47
Year:
2002
Language:
english
Pages:
6
DOI:
10.1016/s0013-4686(02)00088-9
File:
PDF, 297 KB
english, 2002
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