[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - New Modes of Fast Fourier Impedance Spectroscopy Applied to Solar Materials Characterization and Semiconductor Pore Etching
Carstensen, Juergen, Foell, HelmutYear:
2009
Language:
english
DOI:
10.1149/1.3204390
File:
PDF, 2.39 MB
english, 2009