[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Electrical Properties of Lanthanum-scandate Gate Dielectric Directly Deposited on Ge
Bera, M.K. K., Song, J., Kakushima, Kuniyuki, Ahmet, Parhat, Tsutsui, Kazuo, Sugii, Nobuyuki, Hattori, Takeo, Iwai, HiroshiYear:
2009
Language:
english
DOI:
10.1149/1.3206607
File:
PDF, 878 KB
english, 2009