3-D constraint effects on J testing and crack tip constraint in M(T), SE(B), SE(T) and C(T) specimens: numerical study
Yun-Jae Kim, Jin-Su Kim, Soo-Man Cho, Young-Jin KimVolume:
71
Year:
2004
Language:
english
Pages:
16
DOI:
10.1016/s0013-7944(03)00211-x
File:
PDF, 779 KB
english, 2004