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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - Z-scan determination of third-order nonlinear optical properties of Poly(4,4'-diazobenzene-2,5-thiophene)
Shao, Huawei, Xiang, Mei, Jia, Zhenhong, Lü, Xiaoyi, Ye, Shenghua, Zhang, Guangjun, Ni, JunVolume:
7160
Year:
2009
Language:
english
DOI:
10.1117/12.810995
File:
PDF, 307 KB
english, 2009