Quantitative Surface Atomic Structure Analysis by...

Japanese Journal of Applied Physics 1985 / 10 Vol. 24; Iss. Part 1, No

Quantitative Surface Atomic Structure Analysis by Low-Energy Ion Scattering Spectroscopy (ISS)

Aono, Masakazu, Souda, Ryutaro
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Volume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.1249
Date:
October, 1985
File:
PDF, 2.51 MB
1985
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