Fatigue crack growth measurements under spectrum loading

Fatigue crack growth measurements under spectrum loading

Kentaro Yamada, Qiuliang Cao, Naoki Okado
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Volume:
66
Year:
2000
Language:
english
Pages:
15
DOI:
10.1016/s0013-7944(99)00143-5
File:
PDF, 458 KB
english, 2000
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