Comparison of Atomic Force Microscopy and Scanning Ion...

Langmuir 2015 / 06 Vol. 31; Iss. 24

Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging

Seifert, Jan, Rheinlaender, Johannes, Novak, Pavel, Korchev, Yuri E., Schäffer, Tilman E.
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Volume:
31
Language:
english
Journal:
Langmuir
DOI:
10.1021/acs.langmuir.5b01124
Date:
June, 2015
File:
PDF, 1.55 MB
english, 2015
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