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SPIE Proceedings [SPIE 1988 Intl Congress on Optical Science and Engineering - Hamburg, Germany (Monday 19 September 1988)] In-Process Optical Measurements - Miniature Light Scattering Systems For On-Line Process Particle Size And Velocity Measurement
Brown, R. G. W., Burnett, J. G., Chow, K., Rarity, J. G., Spring, Kenneth H.Volume:
1012
Year:
1989
Language:
english
DOI:
10.1117/12.949341
File:
PDF, 9.33 MB
english, 1989