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SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Material removal rate based on edge effects in ultraprecision polishing process
Yang, Wei, Guo, YinBiao, Xu, Qiao, Yang, Li, Schoen, John M., Namba, Yoshiharu, Li, ShengyiVolume:
7282
Year:
2009
Language:
english
DOI:
10.1117/12.830791
File:
PDF, 292 KB
english, 2009