Constant Photo-EPR: A New Method for Deep Level...

Constant Photo-EPR: A New Method for Deep Level Characterization

Jantsch, W., Brunthaler, G., Hendorfer, G.
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Volume:
10-12
Year:
1986
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.10-12.515
File:
PDF, 374 KB
1986
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