Boron-Oxygen-Related Defect in Silicon
Khirunenko, Lyudmila I., Pomozov, Yurii V., Sosnin, Mikhail G., Duvanskii, A.V.Volume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.178-179.178
Date:
August, 2011
File:
PDF, 305 KB
english, 2011