Atomic-scale Characterization of HF-treated 4H-SiC(0001)1×1...

MRS Proceedings 2007 / 1 Vol. 996

Atomic-scale Characterization of HF-treated 4H-SiC(0001)1×1 Surfaces by Scanning Tunneling Microscopy

Arima, Kenta, Hara, Hideyuki, Sano, Yasuhisa, Yagi, Keita, Okamoto, Ryota, Murata, Junji, Mimura, Hidekazu, Yamauchi, Kazuto
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
996
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0996-H07-06
Date:
January, 2007
File:
PDF, 721 KB
english, 2007
Conversion to is in progress
Conversion to is failed