SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Thin-Film Coatings for Optical Applications IV - Analyses of structural films using effective refractive index model
Chang, Te-Hung, Yeh, Yu-Wen, Chen, Sheng-Hui, Lee, Cheng-Chung, Ellison, Michael J.Volume:
6674
Year:
2007
Language:
english
DOI:
10.1117/12.733595
File:
PDF, 746 KB
english, 2007