Diffraction Microscopy using 20-kV Electron Beam for Multi-Wall Carbon Nanotubes
Kamimura, Osamu, Kawahara, Kota, Doi, Takahisa, Dobashi, Takashi, Abe, Takashi, Gohara, KazutoshiVolume:
1026
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1026-C07-06
Date:
January, 2007
File:
PDF, 257 KB
english, 2007