[IEEE 2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2015.4.27-2015.4.29)] VLSI Design, Automation and Test(VLSI-DAT) - A 84.7-DR wide BW incremental ADC using CT structure
Wang, Ting-Yang, Lee, Tai-ChengYear:
2015
Language:
english
DOI:
10.1109/VLSI-DAT.2015.7114519
File:
PDF, 1.06 MB
english, 2015