Microstructure Characterization of Si/Ni Contact Layers on...

Materials Science Forum 2014 / 2 Vol. 778-780

Microstructure Characterization of Si/Ni Contact Layers on n-Type 4H-SiC by TEM and XEDS

Wzorek, Marek, Czerwiński, Andrzej, Ratajczak, Jacek, Borysiewicz, Michał A., Kuchuk, Andrian V., Piotrowska, Anna, Kątcki, Jerzy
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Volume:
778-780
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.778-780.697
Date:
February, 2014
File:
PDF, 480 KB
english, 2014
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