[IEEE 2015 20th Asia and South Pacific Design Automation Conference (ASP-DAC) - Chiba, Japan (2015.1.19-2015.1.22)] The 20th Asia and South Pacific Design Automation Conference - BEE: Predicting realistic worst case and stochastic eye diagrams by accounting for correlated bitstreams and coding strategies
Karthik, Aadithya V., Ray, Sayak, Roychowdhury, JaijeetYear:
2015
Language:
english
DOI:
10.1109/ASPDAC.2015.7059032
File:
PDF, 3.24 MB
english, 2015