SPIE Proceedings [SPIE Electronic Imaging '97 - San Jose, CA (Saturday 8 February 1997)] Very High Resolution and Quality Imaging II - Sharpness, sharpness-related attributes, and their physical correlates
Nijenhuis, Marco, Hamberg, Roelof, Teunissen, Cornelis, Bech, Soren, Looren de Jong, Henny, Houben, Paul, Pramanik, Sakti K., Algazi, V. Ralph, Ono, Sadayasu, Tescher, Andrew G.Volume:
3025
Year:
1997
Language:
english
DOI:
10.1117/12.270052
File:
PDF, 391 KB
english, 1997