SPIE Proceedings [SPIE Electronic Imaging '97 - San Jose,...

  • Main
  • SPIE Proceedings [SPIE Electronic...

SPIE Proceedings [SPIE Electronic Imaging '97 - San Jose, CA (Saturday 8 February 1997)] Very High Resolution and Quality Imaging II - Sharpness, sharpness-related attributes, and their physical correlates

Nijenhuis, Marco, Hamberg, Roelof, Teunissen, Cornelis, Bech, Soren, Looren de Jong, Henny, Houben, Paul, Pramanik, Sakti K., Algazi, V. Ralph, Ono, Sadayasu, Tescher, Andrew G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
3025
Year:
1997
Language:
english
DOI:
10.1117/12.270052
File:
PDF, 391 KB
english, 1997
Conversion to is in progress
Conversion to is failed