On the absolute configuration determination by X-ray diffraction data
Martinez-Ripoll, M., Fayos, J.Volume:
152
Language:
english
Journal:
Zeitschrift für Kristallographie - Crystalline Materials
DOI:
10.1524/zkri.1980.152.14.189
Date:
January, 1980
File:
PDF, 283 KB
english, 1980