On the absolute configuration determination by X-ray...

On the absolute configuration determination by X-ray diffraction data

Martinez-Ripoll, M., Fayos, J.
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Volume:
152
Language:
english
Journal:
Zeitschrift für Kristallographie - Crystalline Materials
DOI:
10.1524/zkri.1980.152.14.189
Date:
January, 1980
File:
PDF, 283 KB
english, 1980
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