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The Structural and Electrical Properties of CuNi Thin-Film Resistors Grown on AlN Substrates for Π-Type Attenuator Application
Hur, Sung-Gi, Kim, Dong-Jin, Kang, Byoung-Don, Yoon, Soon-GilVolume:
152
Year:
2005
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1901675
File:
PDF, 900 KB
english, 2005