Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy
Reshanov, Sergey A., Schneider, Konrad, Helbig, Reinhard, Pensl, Gerhard, Nagasawa, Hiroyuki, Schöner, AdolfVolume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.457-460.513
File:
PDF, 212 KB
english, 2004