Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep...

Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy

Reshanov, Sergey A., Schneider, Konrad, Helbig, Reinhard, Pensl, Gerhard, Nagasawa, Hiroyuki, Schöner, Adolf
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Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.457-460.513
File:
PDF, 212 KB
english, 2004
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