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Effect of Cu Migration in a Field Induced Dielectric Failure
Hwang, Sang-Soo, Jung, Sung-Yup, Joo, Young-ChangVolume:
914
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0914-F06-07
Date:
January, 2006
File:
PDF, 421 KB
english, 2006