ECS Transactions [ECS China Semiconductor Technology...

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ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - Optimization of nLDMOS Ruggedness under Unclamped Inductive Switching (UIS) Stress Conditions by Poly-Gate Extension

Agarwal, Neelam, Sharma, Karuna N., Tsai, Jung-Ruey, Sheu, Gene, Yang, Shao-Ming
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Year:
2012
Language:
english
DOI:
10.1149/1.3694306
File:
PDF, 315 KB
english, 2012
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