SPIE Proceedings [SPIE Photonics West '98 Electronic...

  • Main
  • SPIE Proceedings [SPIE Photonics West...

SPIE Proceedings [SPIE Photonics West '98 Electronic Imaging - San Jose, CA (Saturday 24 January 1998)] Scientific Detection of Fakery in Art - Applications of x rays in art authentication: radiography, x-ray diffraction, and x-ray fluorescence

Newman, Richard, McCrone, Walter, Chartier, Duane R., Weiss, Richard J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
3315
Year:
1998
Language:
english
DOI:
10.1117/12.308590
File:
PDF, 581 KB
english, 1998
Conversion to is in progress
Conversion to is failed