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SPIE Proceedings [SPIE Photonics West '98 Electronic Imaging - San Jose, CA (Saturday 24 January 1998)] Scientific Detection of Fakery in Art - Applications of x rays in art authentication: radiography, x-ray diffraction, and x-ray fluorescence
Newman, Richard, McCrone, Walter, Chartier, Duane R., Weiss, Richard J.Volume:
3315
Year:
1998
Language:
english
DOI:
10.1117/12.308590
File:
PDF, 581 KB
english, 1998