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Direct Observation of Heat Transport in Plural AlN Films Using Thermal Imaging and Transient Thermal Reflectance Method
Lee, Taehun, Burzo, Mihai G., Komarov, Pavel L., Raad, Peter E., Kim, M. J.Volume:
14
Year:
2011
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.3543896
File:
PDF, 1.35 MB
english, 2011