TEM Characterization of near Sub-Grain Boundary...

Solid State Phenomena 2011 / 8 Vol. 178-179

TEM Characterization of near Sub-Grain Boundary Dislocations in Directionally Solidified Multicrystalline Silicon

Kivambe, Maulid, Stokkan, Gaute, Ervik, Torunn, Ryningen, Birgit, Lohne, Otto
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Volume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.178-179.307
Date:
August, 2011
File:
PDF, 6.38 MB
english, 2011
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