Determination of Stress Gradients in a Thermally Grown Oxide Layer Using X-Ray Diffraction
Zhu, Di, Stout, J.H., Shores, D.A.Volume:
251-254
Year:
1997
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.251-254.333
File:
PDF, 615 KB
english, 1997