![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 13 April 2015)] Damage to VUV, EUV, and X-ray Optics V - X-ray-induced electron cascades in dielectrics modeled with XCASCADE code: effect of impact ionization cross sections
Juha, Libor, Bajt, Saša, London, Richard, Medvedev, Nikita A.Volume:
9511
Year:
2015
Language:
english
DOI:
10.1117/12.2182767
File:
PDF, 155 KB
english, 2015