SPIE Proceedings [SPIE SPIE Optics + Optoelectronics -...

  • Main
  • SPIE Proceedings [SPIE SPIE Optics +...

SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 13 April 2015)] Damage to VUV, EUV, and X-ray Optics V - X-ray-induced electron cascades in dielectrics modeled with XCASCADE code: effect of impact ionization cross sections

Juha, Libor, Bajt, Saša, London, Richard, Medvedev, Nikita A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9511
Year:
2015
Language:
english
DOI:
10.1117/12.2182767
File:
PDF, 155 KB
english, 2015
Conversion to is in progress
Conversion to is failed