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Pore Seal Property of Ultra-thin Layer for Porous Low-k Films revealed by Ellipsometric Porosimetry
Ono, Shoko Sugiyama, Kayaba, Yasuhisa, Suzuki, Tsuneji, Tanaka, Hirofumi, Kohmura, KazuoVolume:
1428
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2012.1354
Date:
January, 2012
File:
PDF, 370 KB
english, 2012