![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Layered fast correlation tracking algorithm combined with target feature
Bai, Yang, Jia, Hong-guang, Guo, Li-hong, Zhang, Rong-hui, Zhang, Yudong, Wyant, James C., Smythe, Robert A., Wang, HexinVolume:
7283
Year:
2009
Language:
english
DOI:
10.1117/12.828826
File:
PDF, 476 KB
english, 2009