SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Auto-focusing technology for photoelectric measurement system
Lei, Tao, Yang, Sihan, Zhang, Yong, Wu, Qinzhang, Zhang, Yudong, Wyant, James C., Smythe, Robert A., Wang, HexinVolume:
7283
Year:
2009
Language:
english
DOI:
10.1117/12.828804
File:
PDF, 287 KB
english, 2009