Electron Microscopy Data for Threshold Energy of Point...

Materials Science Forum 1986 Vol. 10-12

Electron Microscopy Data for Threshold Energy of Point Defect Creation in Silicon

Fedina, Liudmila I., Aseev, A.L., Denisenko, S.G., Smirnov, L.S.
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Volume:
10-12
Year:
1986
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.10-12.1123
File:
PDF, 543 KB
english, 1986
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