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Incremental Circuit and Sensitivity Simulations Using Iterated Timing Analysis Algorithm
Chen, Chun Jung, Chen, Yu Wei, Tsai, Chang Lung, Lee, Chih Jen, Sun, Jenn DongVolume:
748
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.748.839
Date:
August, 2013
File:
PDF, 282 KB
english, 2013