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Hard X-ray photoelectron spectra (HXPES) of bulk non-conductor vitreous SiO2: Minimum linewidths and surface chemical shifts
Hu, Y.F., Xiao, Q., Wang, D., Cui, X., Nesbitt, H.W., Bancroft, G.M.Volume:
202
Language:
english
Journal:
Journal of Electron Spectroscopy and Related Phenomena
DOI:
10.1016/j.elspec.2015.04.018
Date:
July, 2015
File:
PDF, 540 KB
english, 2015