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Use of genetic algorithms for the simultaneous estimation of thin films thermal conductivity and contact resistances
S. Orain, Y. Scudeller, S. Garcia, T. BrousseVolume:
44
Year:
2001
Language:
english
Pages:
12
DOI:
10.1016/s0017-9310(01)00025-4
File:
PDF, 625 KB
english, 2001