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Seebeck Coefficient Metrology: Do Contemporary Protocols Measure Up?
Martin, Joshua, Wong-Ng, Winnie, Green, Martin L.Volume:
44
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-015-3640-9
Date:
June, 2015
File:
PDF, 501 KB
english, 2015