Modeling of ESR in metallized film capacitors and its...

Microelectronics Reliability 2015 / 06 Vol. 55; Iss. 7

Modeling of ESR in metallized film capacitors and its implication on pulse handling capability

Li, Hua, Huang, Xiang, Li, Zhiwei, Li, Haoyuan, Wang, Wenjuan, Wang, Bowen, Zhang, Qin, Lin, Fuchang
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Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.04.007
Date:
June, 2015
File:
PDF, 2.13 MB
english, 2015
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