![](/img/cover-not-exists.png)
From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope
Warren, OL, Asif, SA S, Minor, AM, Shan, Z, Stach, EAVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606062726
Date:
August, 2006
File:
PDF, 219 KB
english, 2006