TEM Characterization of Microtwins in VOx thin films

Microscopy and Microanalysis 2008 / 8 Vol. 14; Iss. S2

TEM Characterization of Microtwins in VOx thin films

Li, J, Gauntt, BD, Dickey, EC
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Volume:
14
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927608086790
Date:
August, 2008
File:
PDF, 305 KB
english, 2008
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