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Electron Microscopy Characterization of Fe-Ga and Fe-Si-B Fine Particles
Solomon, VC, Smith, DJ, Hong, J-I, Berkowitz, AEVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609097992
Date:
July, 2009
File:
PDF, 2.31 MB
english, 2009