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Electron Probe Microanalysis of Thin Films and Multilayers Using the Computer Program XFILM
Llovet, Xavier, Merlet, ClaudeVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609991218
Date:
February, 2010
File:
PDF, 691 KB
english, 2010