Electron Probe Microanalysis of Thin Films and Multilayers...

Electron Probe Microanalysis of Thin Films and Multilayers Using the Computer Program XFILM

Llovet, Xavier, Merlet, Claude
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609991218
Date:
February, 2010
File:
PDF, 691 KB
english, 2010
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