Resolving 45 pm with 300 kV Aberration Corrected STEM
Sawada, H., Shimura, N., Satoh, K., Okunishi, E., Hosokawa, F., Shibata, N., Ikuhara, Y.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614002347
Date:
August, 2014
File:
PDF, 1.54 MB
english, 2014