Monte Carlo Modeling of Ion Beam Induced Secondary...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

Huh, U., Cho, W., Ramachandra, R., Joy, D. C.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614003237
Date:
August, 2014
File:
PDF, 1.38 MB
english, 2014
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