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A Double Silicon Drift Type Detector System for EDS with Ultrahigh Efficiency and Throughput for TEM
Kawai, S., Onishi, I., Ishikawa, T., Yagi, K., Iwama, T., Miyatake, K., Iwasawa, Y., Matsushita, M., Kaneyama, T., Kondo, Y.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761400748x
Date:
August, 2014
File:
PDF, 1.23 MB
english, 2014