In-situ Scanning Transmission Electron Microscopy Annealing...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

In-situ Scanning Transmission Electron Microscopy Annealing Studies of Ni1-xCrx Nanocluster and Correlation with Magnetic Properties

Diaz, Rosa E., Bohra, Murtaza, Singh, Vidyadhar, Sowwan, Mukhles
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614010058
Date:
August, 2014
File:
PDF, 1.32 MB
english, 2014
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