Simultaneous EELS/EDS Composition Mapping at Atomic...

Microscopy Today 2013 / 7 Vol. 21; Iss. 4

Simultaneous EELS/EDS Composition Mapping at Atomic Resolution Using Fast STEM Spectrum-Imaging

Longo, Paolo, Thomas, Paul, Aitouchen, Aziz, Schaffer, Bernhard, Twesten, Ray D.
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Volume:
21
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/s1551929513000643
Date:
July, 2013
File:
PDF, 4.05 MB
english, 2013
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