Ultrasound influence on I–V–T characteristics of silicon...

Ultrasound influence on I–V–T characteristics of silicon Schottky barrier structure

Olikh, O. Ya., Voytenko, K. V., Burbelo, R. M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
117
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4906844
Date:
January, 2015
File:
PDF, 1.91 MB
english, 2015
Conversion to is in progress
Conversion to is failed