Testing for floating gate faults in CMOS combinational...

International Journal of Electronics 1991 / 11 Vol. 71; Iss. 5

Testing for floating gate faults in CMOS combinational circuits

ISMAEEL, ASAD A.
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Volume:
71
Language:
english
Journal:
International Journal of Electronics
DOI:
10.1080/00207219108925532
Date:
November, 1991
File:
PDF, 307 KB
english, 1991
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